#FCMN2024
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  • Overview
    • Code of Conduct (PDF)
    • Committee
  • Hotel/Travel
    • Things To Do
  • Registration
  • Schedule
    • Invited Speakers
    • Presentation & Poster Guidelines
    • Technical Program (PDF)
    • Tutorials
      • Tutorial Session I – Machine Learning and its Application to Metrology
      • Tutorial Session II – Metrology Techniques
      • Tutorial Session III – Advanced Packaging
  • Sponsors/Exhibitors
    • Sponsor & Exhibitor Form (PDF)

Committee

Program Co-Chairs:

  • J. Alexander Liddle, NIST
  • Alain Diebold, University of Albany
  • Markus Kuhn, Rigaku
  • Zhiyong Ma, Intel
  • Paul van der Heide, IMEC

Program Committee

  • Ofer Adan, Applied Materials
  • Jean-Paul Barnes, CEA-Leti
  • Alan Brodie, KLA-Tencor
  • Steve Consiglio, TEL Technology Center
  • Michael Current, Current Scientific
  • Frank de Jong, Thermo Fisher
  • Ye Feng, Intel
  • Christina Hacker, NIST
  • Ajey Jacob, University of Southern California
  • Shunsuke Koshihara, Hitachi High-Tech Corporation
  • Bob McDonald, formerly of Intel (Treasurer)
  • Baohua Niu, Intel TD Failure Analysis and Defect Metrology
  • Shinichi Ogawa, AIST
  • Erik Secula, NIST
  • David Seiler, NIST
  • Usha Varshney, NSF
  • Jin Zhang, Lam Research
  • Ehrenfried Zschech, Brandenburg University of Technology Cottbus – Senftenberg, Institute of Physics

Conference Information

AVS
Della Miller
110 Yellowstone Dr., Suite 120
Chico CA 95973

Phone: 530-896-0477
Fax: 530-896-0487
E-mail: della@avs.org

Questions?

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Key Dates

Abstract Submission Deadline Extended:
December 15, 2023

Author Notifications:
Late December-Early January

Early Registration Deadline:
February 15, 2024

Hotel Reservation Deadline:
March 18, 2024

Downloads

  • Code of Conduct (PDF)
  • Sponsor Form
  • Presentation & Poster Guidelines

AVS
Della Miller

Event Manager
110 Yellowstone Dr. Suite 120
Chico, CA 95973
(530) 896-0477
della@avs.org

OverviewHotel/TravelRegistrationScheduleSponsors/Exhibitors
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